Memory corruption may occur while processing IOCTL call for DMM/WARPNCC CONFIG request.
wcd9385
Vendor: qualcomm
Security Vulnerability Index
Page 12 / 138Memory corruption while handling invalid inputs in application info setup.
Transient DOS while parsing the EPTM test control message to get the test pattern.
Memory corruption due to global buffer overflow when a test command uses an invalid payload type.
Memory corruption due to double free when multiple threads race to set the timestamp store.
Information disclosure when Video engine escape input data is less than expected minimum size.
Memory corruption while selecting the PLMN from SOR failed list.
memory corruption while loading a PIL authenticated VM, when authenticated VM image is loaded without maintaining cache coherency.
Information disclosure while decoding this RTP packet headers received by UE from the network when the padding bit is set.